DocumentCode :
2271954
Title :
3-dimensional electric field visualization utilizing electric-field-induced-second harmonic-generation in liquid crystals
Author :
Shi-Wei Chu ; Bresson, F. ; I-Hsiu Chen ; Jin-Wei Shi ; Ming-Chun Tien ; Chi-Kuang Sun ; Hernandez, F.E.
Author_Institution :
Graduate Inst. of Electro-Opt. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
2002
fDate :
24-24 May 2002
Firstpage :
450
Abstract :
Summary form only given. As a result of the wide use of electronic and optoelectronics devices, the need for an efficient tool to characterize integrated circuits (IC) is growing up. Electric-field-induced-second-harmonic-generation (EFISHG) measurement shows some advantages over an EO sampling technique. We demonstrate a 3D electric-field visualization utilizing the EFISHG effect in nematic liquid crystals. The visualization was easily achieved with a second-harmonic-generation (SHG) confocal microscope with high spatial resolution on the order of or less than 1 /spl mu/m. With the great sectioning power in a confocal microscope, 3D images can be easily obtained combining different height images.
Keywords :
electric field measurement; electro-optical effects; image resolution; integrated circuit measurement; nematic liquid crystals; optical harmonic generation; optical microscopy; 3D electric field visualization; EFISHG effect; IC characterisation; SHG confocal microscope; different height images; electric-field-induced-second harmonic-generation; high spatial resolution; nematic liquid crystals; sectioning power; Diode lasers; Electric variables measurement; Liquid crystals; Microscopy; Optical frequency conversion; Optical harmonic generation; Optical pumping; Optical sensors; Phase measurement; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
Type :
conf
DOI :
10.1109/CLEO.2002.1034190
Filename :
1034190
Link To Document :
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