DocumentCode :
2272096
Title :
A modular and economical traumatic brain injury device for rodent models
Author :
Wahab, Rosmawati Abd ; Mina, S. ; Dobiszewki, K. ; Pfister, B.J.
Author_Institution :
New Jersey Inst. of Technol., Newark, NJ, USA
fYear :
2010
fDate :
26-28 March 2010
Firstpage :
1
Lastpage :
2
Abstract :
A novel, modular device was designed to reproduce two traumatic brain injury models used in the rat and mouse: fluid percussion injury (FPI) and controlled cortical impact (CCI). Commercially available TBI devices are often unimethodical, expensive and sensitive to experimental variability. To achieve maximum control and sensitivity, we utilized a closed loop voice coil control device to more accurately and precisely generate the temporal force function delivered by the CCI and FPI methods. Modular FPI and CCI components were designed for use with this common voice coil system, thereby creating a device that is less expensive, better controlled, and more user friendly than current systems. Through in vitro bench testing with a pressure transducer, we have shown that the pressure generated by our voice coil-controlled simulation device is comparable to results obtained from literature where commercially available devices were utilized. Additionally, we are researching new craniotomy and mounting protocols to precisely control the placement and alignment of the device to the cranium for precise and reproducible injury to the brain.
Keywords :
biomedical equipment; brain; injuries; neurophysiology; pressure transducers; CCI; FPI; TBI devices; closed loop voice coil control device; controlled cortical impact; craniotomy; fluid percussion injury; pressure transducer; rodent models; temporal force function; traumatic brain injury device; voice coil controlled simulation device; Brain injuries; Brain modeling; Coils; Control systems; Force control; In vitro; Mice; Radiofrequency interference; Rodents; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bioengineering Conference, Proceedings of the 2010 IEEE 36th Annual Northeast
Conference_Location :
New York, NY
Print_ISBN :
978-1-4244-6879-9
Type :
conf
DOI :
10.1109/NEBC.2010.5458112
Filename :
5458112
Link To Document :
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