Fluorinated fullerenes: Nanomaterials for electronic

Author

Bakhtizin, R.Z.

Author_Institution

Bashkir State Univ., Ufa, Russia

fYear

2014

fDate

June 30 2014-July 4 2014

Firstpage

1

Lastpage

1

Abstract

Scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS) under ultra-high vacuum conditions have been used to study the initial stages of adsorption of fluorinated fullerene molecules C60F36 and C60F18 on Si(111)-7×7 surface. Spatially resolved images of individual C60F36 and C60F18 fluorofullerene molecules on Si(111)-7×7 surface have been obtained. The HOMO-LUMO gap of the adsorbed molecules has been estimated from spectroscopic measurements.

Keywords

adsorption; elemental semiconductors; fullerene compounds; scanning tunnelling microscopy; scanning tunnelling spectroscopy; silicon; C₆₀F₁₈; C₆₀F₃₆; HOMO-LUMO gap; STM; Si; Si(111) surface; adsorbed molecules; fluorinated fullerene molecules; initial adsorption stages; nanomaterials; scanning tunneling microscopy; scanning tunneling spectroscopy; spatially resolved images; spectroscopic measurements; ultrahigh vacuum conditions; Adsorption; Nanomaterials; Scanning electron microscopy; Spatial resolution; Spectroscopy; Tunneling;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electron Sources Conference (IVESC), 2014 Tenth International

Conference_Location

St. Petersburg

Print_ISBN

978-1-4799-5770-5

Type

conf

DOI

10.1109/IVESC.2014.6891946

Filename

6891946