Title :
Probabilities associated with a built-in-test system, focus on false alarms
Author_Institution :
Corona Div., Naval Surface Warfare Center, Corona, CA, USA
Abstract :
This paper shows that some built-in-test (BIT) systems have an intrinsic 50 percent false alarm rate. The paper also shows how Bayes´ theorem can be used to analyze how variation of BIT characteristics can increase or decrease the intrinsic false alarm rate.
Keywords :
Bayes methods; built-in self test; probability; BIT systems; Bayes theorem; built-in-test system; false alarm probability; intrinsic false alarm rate; Aircraft; Condition monitoring; Corona; Costs; IEEE members; Life testing; Personnel; System testing; Test equipment; Transfer functions;
Conference_Titel :
AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. Proceedings
Print_ISBN :
0-7803-7837-7
DOI :
10.1109/AUTEST.2003.1243644
