Title :
Measurement of spontaneous emission spectrum in vertical-cavity surface-emitting lasers
Author :
Hsu, A. ; Chuang, S.L.
Author_Institution :
Illinois Univ., Urbana, IL, USA
Abstract :
Summary form only given. We describe an improved method for measuring the spontaneous emission (SE) spectra from the cleaved side of a VCSEL cavity using a 62.5-/spl mu/m multimode fiber and present experimental results. The VCSEL under study was grown and fabricated in the AlGaAs/GaAs material system. The advantage of this method is that distortion due to top transmission measurements through the distributed Bragg reflectors and filters is avoided. Furthermore, by integrating the SE spectrum rather than directly measuring side emission power, we ensure that the side emission is indeed SE and not due to scattering of stimulated emission from the resonant cavity into the side emission.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; quantum well lasers; spontaneous emission; surface emitting lasers; 62.5 micron; AlGaAs-GaAs; AlGaAs/GaAs material system; VCSEL cavity; distortion avoidance; distributed Bragg reflectors; multimode fiber; side emission; spectrum integration; spontaneous emission spectrum; top transmission measurements; Distortion measurement; Distributed Bragg reflectors; Fiber lasers; Filters; Gallium arsenide; Optical materials; Power measurement; Spontaneous emission; Surface emitting lasers; Vertical cavity surface emitting lasers;
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
DOI :
10.1109/CLEO.2002.1034211
