• DocumentCode
    2272438
  • Title

    Effects of dopants on wettability and microstructure evolution of Lead-Free solder joints

  • Author

    Chen, Qiang ; Li, Guoyuan

  • Author_Institution
    Sch. of Electron. & Inf. Eng., South China Univ. of Technol., Guangzhou, China
  • fYear
    2010
  • fDate
    16-19 Aug. 2010
  • Firstpage
    314
  • Lastpage
    318
  • Abstract
    In this study, the synergy effects of Sb and rare earth (RE) element addition on the wettability and microstructure evolution of Lead-Free solder joints are investigated. Experiment results indicate that Sb and RE element possibly had synergy effect on improving the wettability of lead-free solder. It is found that Sn-3.0Ag-0.5Cu-0.8Sb-XY, with X ranging between 0.05 and 0.1, has the best wettability on Cu substrate. The thickness of IMC increases as the amount of yttrium increase from 0wt% to 0.25wt% in the SAC-0.8Sb-Xwt%Y/Cu system.When the yttrium concentration is increased from 0.25wt% to 0.5wt%, the IMC thickness decreases. Further increase in the RE concentration just results in a slightly increasement of the IMC thickness. Considering the wettability and IMC growth, it is found that the optimal composition of the Y is about 0.5wt%. Results in this study just reveal that simutenuasly adding 0.8wt% of Sb and some Y does not have obvious effect on suppression of the IMC growth of the SAC-0.8Sb-Xwt%Y/Cu solder joints.
  • Keywords
    rare earth metals; solders; wetting; dopants effects; lead-free solder joints; microstructure evolution; rare earth element; synergy effects; wettability; Copper; Lead; Microstructure; Soldering; Substrates; Yttrium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-8140-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2010.5582338
  • Filename
    5582338