DocumentCode
2272454
Title
An investigation into copper oxidation behavior
Author
Zhao, Wenting ; Wu, Jiechen ; Hu, Anmin ; Li, Ming ; Mao, Dali
Author_Institution
Sch. of Mater. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
fYear
2010
fDate
16-19 Aug. 2010
Firstpage
319
Lastpage
323
Abstract
Copper electrodeposited on nickel and copper alloys substrates is easy to be oxidized, and the adhesion between the oxides and substrates can be so poor that delamination happens at these interfaces, which may lead to an overall failure to the electronic device. In this work, three different substrates were prepared by applying direct current; of all these substrates the amorphous nickel-phosphorous substrate was barely discussed in previous literature. The surface morphology, the orientation of electrodeposited copper film, the composition of oxide and the oxidation kinetics were investigated. The result showed that the nickel-phosphorous substrate electrodeposited with copper was superior to the other two specimens in oxidation resistance property. It is mainly attributed to the nickel-phosphorous substrate has an even surface and it owns a higher activation energy when oxided.
Keywords
copper alloys; delamination; electrodeposition; electronics packaging; nickel alloys; oxidation; surface morphology; amorphous nickel-phosphorous substrate; copper alloys; copper oxidation behavior; delamination; electrodeposition; nickel alloys; oxidation kinetics; oxidation resistance; surface morphology; Copper; Films; Nickel; Oxidation; Substrates; Surface morphology; copper alloy; diffusion coefficient; electronic packaging; lead frame material; oxidation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-8140-8
Type
conf
DOI
10.1109/ICEPT.2010.5582339
Filename
5582339
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