Title :
Investigation of the detection efficiency of polycrystalline diamond detectors with a heavy ion microprobe
Author :
Schloegl, M. ; Fischer, B.E.
Author_Institution :
Gesellschaft fur Schwerionenforschung mbH, Darmstadt, Germany
Abstract :
The influence of the crystal structure of chemical vapour deposition (CVD) diamonds on their charge collection efficiency has been investigated by using a heavy ion microprobe with C ions of 5.9 MeV/u. Charge collection maps and pulse-height spectra are discussed. A comparison of the charge collection maps with the corresponding secondary electron image shows that not only the grain boundaries are responsible for the poor charge collection efficiency, but also the single CVD diamond crystal is trapping a significant part of the generated charge
Keywords :
CVD coatings; diamond; semiconductor counters; C; charge collection efficiency; charge trapping; chemical vapour deposition; crystal structure; grain boundary; heavy ion microprobe; polycrystalline diamond detector; pulse height spectra; secondary electron imaging; Charge carrier mobility; Chemical vapor deposition; Crystalline materials; Crystals; Dosimetry; Electron traps; Grain boundaries; Pulse measurements; Radiation detectors; Topology;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on
Conference_Location :
Fontevraud
Print_ISBN :
0-7803-5726-4
DOI :
10.1109/RADECS.1999.858561
