Title :
Picosecond dual-source interferometer extending Fourier-transform spectrometer to microwave regime
Author :
van der Weide, D.W. ; Keilmann, F.
Author_Institution :
Dept. of Electr. Eng., Delaware Univ., Newark, DE, USA
Abstract :
We report a dual-source interferometer based on nonlinear transmission lines and integrated antennas which interfaces directly with a Fourier-transform infrared (FTIR) spectrometer to enable longer-wavelength measurements than normally possible with a black-body source. As a demonstration, we show preliminary transmission measurements through a plate of high-resistivity silicon.
Keywords :
Fourier transform spectrometers; electromagnetic wave interferometers; electromagnetic wave interferometry; microwave spectrometers; microwave spectroscopy; Fourier-transform infrared spectrometer; Si; high-resistivity silicon plate; integrated antenna; long-wavelength measurement; microwave spectrometer; nonlinear transmission line; picosecond dual-source interferometer; transmission measurement; Antenna measurements; Diodes; Infrared spectra; Microwave measurements; Pulse generation; Silicon; Spectroscopy; Structural beams; Superconducting transmission lines; Transmission line measurements;
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-3246-6
DOI :
10.1109/MWSYM.1996.512276
