DocumentCode :
2272771
Title :
Analysis of HEMT harmonic generation using a vector nonlinear measurement system
Author :
Leckey, J.G. ; Stewart, J.A.C. ; Patterson, A.D.
Author_Institution :
Queen´s Univ., Belfast, UK
Volume :
3
fYear :
1996
fDate :
17-21 June 1996
Firstpage :
1739
Abstract :
A study of HEMT harmonic generation was carried out using a Vector Nonlinear Measurement System to measure drain and gate waveforms. The cause of second and third harmonic nulls with increasing input power, and their direct relation to the output IV characteristics is shown. The effect of DC drain current variation with increasing input drive level is also explained. The results indicate the potential for exploiting harmonic nulling behaviour in circuit applications. Analysis of second harmonic dependency on quiescent operating point shows a doubling mode with intrinsic suppression of unwanted third harmonic.
Keywords :
harmonic generation; high electron mobility transistors; microwave field effect transistors; microwave measurement; DC drain current; HEMT harmonic generation; IV characteristics; doubling mode; harmonic nulling; quiescent operating point; vector nonlinear measurement system; waveform; Calibration; Frequency conversion; HEMTs; Harmonic analysis; Microwave measurements; Power measurement; Power system harmonics; Pulse measurements; Radio frequency; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-3246-6
Type :
conf
DOI :
10.1109/MWSYM.1996.512278
Filename :
512278
Link To Document :
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