• DocumentCode
    2272771
  • Title

    Analysis of HEMT harmonic generation using a vector nonlinear measurement system

  • Author

    Leckey, J.G. ; Stewart, J.A.C. ; Patterson, A.D.

  • Author_Institution
    Queen´s Univ., Belfast, UK
  • Volume
    3
  • fYear
    1996
  • fDate
    17-21 June 1996
  • Firstpage
    1739
  • Abstract
    A study of HEMT harmonic generation was carried out using a Vector Nonlinear Measurement System to measure drain and gate waveforms. The cause of second and third harmonic nulls with increasing input power, and their direct relation to the output IV characteristics is shown. The effect of DC drain current variation with increasing input drive level is also explained. The results indicate the potential for exploiting harmonic nulling behaviour in circuit applications. Analysis of second harmonic dependency on quiescent operating point shows a doubling mode with intrinsic suppression of unwanted third harmonic.
  • Keywords
    harmonic generation; high electron mobility transistors; microwave field effect transistors; microwave measurement; DC drain current; HEMT harmonic generation; IV characteristics; doubling mode; harmonic nulling; quiescent operating point; vector nonlinear measurement system; waveform; Calibration; Frequency conversion; HEMTs; Harmonic analysis; Microwave measurements; Power measurement; Power system harmonics; Pulse measurements; Radio frequency; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1996., IEEE MTT-S International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-3246-6
  • Type

    conf

  • DOI
    10.1109/MWSYM.1996.512278
  • Filename
    512278