Title :
An examination of data based large signal models for wireless amplifiers
Author :
Staudinger, J. ; Lan, E.Y. ; Vaitkus, R. ; Lucero, R. ; Hallmark, J.
Author_Institution :
Motorola Semicond. Products Sector, USA
Abstract :
The validity of the assumptions used to construct a data based large signal GaAs MESFET model is examined for wireless RF power amplification. The compliance of measured S-parameter data to model consistency constraints is calculated for a wide region of the device´s I-V plane. Strong compliance is observed at the contour integral point and over localized regions of the I-V plane, but not over extended regions which would be traversed by the dynamic load line of a power amplifier operating in gain compression. These effects ate further examined by comparing harmonic balance predictions of the data based model to that of a common analytical large signal GaAs MESFET model and to load pull measurements of power, efficiency, and linearity.
Keywords :
III-V semiconductors; MESFET circuits; S-parameters; gallium arsenide; power amplifiers; radio equipment; radiofrequency amplifiers; semiconductor device models; GaAs; GaAs MESFET; I-V plane; S-parameter; contour integral point; data based large signal model; dynamic load line; gain compression; harmonic balance; load pull; wireless RF power amplifier; Gallium arsenide; Harmonic analysis; MESFETs; Power amplifiers; Power system harmonics; Predictive models; RF signals; Radio frequency; Scattering parameters; Signal analysis;
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-3246-6
DOI :
10.1109/MWSYM.1996.512280