DocumentCode :
2272834
Title :
Using a carbon beam as a probe to extract the thickness of sensitive volumes
Author :
Inguimbert, C. ; Duzellier, S. ; Ecoffet, R. ; Guibert, L. ; Barak, J. ; Chabot, M.
Author_Institution :
ONERA-CERT, Toulouse, France
fYear :
1999
fDate :
1999
Firstpage :
180
Lastpage :
187
Abstract :
The upset rate calculation depends on the energy deposited along the secondaries paths in a sensitive volume (Sv) of thickness d. We have developed a new extraction method in order to get d from experimental data. It is based upon the deconvolution of the heavy ion upset cross section function σseu(r) with LET(r) (r is the range of the incident ion)
Keywords :
carbon; deconvolution; ion beam effects; C; carbon beam probe; deconvolution; energy deposition; heavy ion irradiation; linear energy transfer; parameter extraction; proton SEU cross section; sensitive volume thickness; upset rate; Charge measurement; Current measurement; Data mining; Deconvolution; Energy measurement; Particle tracking; Predictive models; Probes; Protons; Volume measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on
Conference_Location :
Fontevraud
Print_ISBN :
0-7803-5726-4
Type :
conf
DOI :
10.1109/RADECS.1999.858573
Filename :
858573
Link To Document :
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