• DocumentCode
    2272834
  • Title

    Using a carbon beam as a probe to extract the thickness of sensitive volumes

  • Author

    Inguimbert, C. ; Duzellier, S. ; Ecoffet, R. ; Guibert, L. ; Barak, J. ; Chabot, M.

  • Author_Institution
    ONERA-CERT, Toulouse, France
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    180
  • Lastpage
    187
  • Abstract
    The upset rate calculation depends on the energy deposited along the secondaries paths in a sensitive volume (Sv) of thickness d. We have developed a new extraction method in order to get d from experimental data. It is based upon the deconvolution of the heavy ion upset cross section function σseu(r) with LET(r) (r is the range of the incident ion)
  • Keywords
    carbon; deconvolution; ion beam effects; C; carbon beam probe; deconvolution; energy deposition; heavy ion irradiation; linear energy transfer; parameter extraction; proton SEU cross section; sensitive volume thickness; upset rate; Charge measurement; Current measurement; Data mining; Deconvolution; Energy measurement; Particle tracking; Predictive models; Probes; Protons; Volume measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on
  • Conference_Location
    Fontevraud
  • Print_ISBN
    0-7803-5726-4
  • Type

    conf

  • DOI
    10.1109/RADECS.1999.858573
  • Filename
    858573
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2272834