Title :
Proton-induced single event upset characterization of a 1 Giga-sample per second analog to digital converter
Author :
Reed, R.A. ; Marshall, P.W. ; Carts, M.A. ; Henegar, G.L. ; Katz, R.B.
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
Some high-speed space-borne data acquisition and dissemination systems require conversion of an analog data signal into a digital signal for on-board digital processing. The NASA Geoscience Laser Altimeter System (GLAS) is one such instrument. It uses the Signal Processing Technologies SPT7760 to convert an analog signal from the laser altimeter. The analog data is converted by the SPT7760 at 1 Giga-sample per second (Gsps). These types of data handling applications can typically withstand a relatively high bit error ratio (BER). In this paper, we describe the a novel approach for proton-induced single event upset characterization of the SPT760. Data is given for operating sample rates from 125 Msps to 1 Gsps
Keywords :
analogue-digital conversion; proton effects; space vehicle electronics; GLAS; SPT7760; analog-to-digital converter; bit error ratio; digital signal processing; high-speed data acquisition; laser altimeter; proton induced single event upset; space instrumentation; Analog-digital conversion; Clocks; Data acquisition; Instruments; Manufacturing; NASA; Power lasers; Signal processing; Single event upset; Testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on
Conference_Location :
Fontevraud
Print_ISBN :
0-7803-5726-4
DOI :
10.1109/RADECS.1999.858575
