• DocumentCode
    2272872
  • Title

    A realistic large-signal MESFET model for SPICE

  • Author

    Parker, A.E.

  • Author_Institution
    Dept. Electron., Macquarie Univ., Sydney, NSW, Australia
  • Volume
    3
  • fYear
    1996
  • fDate
    17-21 June 1996
  • Firstpage
    1763
  • Abstract
    A large-signal MESFET model, implemented with new techniques, has continuity and rate dependence. These features provide accurate prediction of circuit gain and distortion. The techniques also improve simulation speed. The model has improved descriptions of capacitance and bias dependence. It has small-signal S-parameter accuracy extended to a wide range of operating conditions. This model is now in several simulators including Pspice v6.2.
  • Keywords
    S-parameters; SPICE; Schottky gate field effect transistors; capacitance; intermodulation; microwave field effect transistors; semiconductor device models; HF S-parameters; Pspice v6.2 simulator; SPICE; bias dependence; capacitance dependence; charge storage model; circuit distortion; circuit gain; continuity dependence; large-signal MESFET model; rate dependence; simulation speed; Capacitance; Circuit simulation; Distortion measurement; Electric breakdown; Frequency; MESFETs; Power dissipation; SPICE; Scattering parameters; Shape control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1996., IEEE MTT-S International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-3246-6
  • Type

    conf

  • DOI
    10.1109/MWSYM.1996.512284
  • Filename
    512284