Title :
Characterizing a polarization splitting quartz crystal
Author :
Wallace, Matthew S. ; Presura, R. ; Pereira, Nino R. ; Kastengren, Alan L.
Author_Institution :
Univ. of Nevada, Reno, NV, USA
Abstract :
Summary form only given. When energetic electrons inside a plasma have a preferred direction the x-rays emitted by the plasma can be polarized. Information about the electrons and the anisotropy of their velocity distribution can then be revealed by the x-ray spectrum´s polarization. Polarization typically measured with two crystals at a 45 degrees Bragg, can now be determined in a new way using one crystal. This crystal utilizes two sets of planes that diffract the incident x-rays in two directions that are perpendicular to each other and to the incident beam1. These diffracted x-rays are then linearly polarized perpendicularly to each other. The polarization splitting properties of quartz crystals were confirmed with the linearly polarized x-rays from the Advanced Photon Source. A crystal with surface cut [10-10] that splits polarization with [11-20] planes at 7.15 keV was among those tested. Bragg reflections at 45 degrees from the crystal´s [10-10] surface planes was then tested with x-rays from conical wire array z-pinches. These tests were aimed to verify the reflectivity of the planes intended for single crystal spectropolarimetric measurements in upcoming experiments.
Keywords :
Z pinch; plasma X-ray sources; plasma diagnostics; polarimetry; reflectivity; Advanced Photon Source; Bragg reflections; X-ray emission; X-ray spectrum polarization; conical wire array Z-pinches; energetic electrons; incident X-ray diffraction; linearly polarized X-rays; plane reflectivity; polarization splitting quartz crystal; single crystal spectropolarimetric measurements; velocity distribution anisotropy; Crystals; Educational institutions; Photonics; Plasma measurements; Plasmas; Polarization; X-rays;
Conference_Titel :
Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS), 2014 IEEE 41st International Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4799-2711-1
DOI :
10.1109/PLASMA.2014.7012289