• DocumentCode
    2273011
  • Title

    Controller hardware-in-the-loop validation for a 10 MVA ETO-based STATCOM for wind farm application

  • Author

    Liu, Yu ; Xi, Zhengping ; Liang, Zhigang ; Song, Wenchao ; Bhattacharya, Subhashish ; Huang, Alex ; Langston, James ; Steurer, Mischa ; Litzenberger, Wayne ; Anderson, Loren ; Adapa, Ram ; Sundaram, Ashok

  • Author_Institution
    NSF FREEDM Syst. Center, North Carolina State Univ., Raleigh, NC, USA
  • fYear
    2009
  • fDate
    20-24 Sept. 2009
  • Firstpage
    1398
  • Lastpage
    1403
  • Abstract
    This paper reports experimental validation of a static synchronous compensation (STATCOM) by controller hardware-in-the-loop (CHIL) testing with a real-time digital simulator (RTDS). The controller is designed and developed for a 10 MVA STATCOM for voltage regulation at the PCC of a 50 MW wind farm connected to a 69 kV utility grid. Emitter Turn-off (ETO) thyristors are switching devices in the multilevel inverter. The STATCOM controller was developed for a cascade multilevel inverter and has been validated on a laboratory test-bench. The CHIL testing of the controller is done with detailed scaled model of the 50 MW wind farm and 69 kV utility system. The experimental results from the RTDS for both steady state and dynamic changes in the STATCOM output validate the STATCOM controller design and performance.
  • Keywords
    control system analysis; invertors; power generation control; static VAr compensators; wind power plants; ETO-based STATCOM; STATCOM controller design; apparent power 10 MVA; cascade multilevel inverter; controller hardware-in-the-loop validation; emitter turn-off thyristors; power 50 MW; real-time digital simulator; static synchronous compensation; voltage 69 kV; voltage regulation; wind farm application; Digital control; Hardware-in-the-loop test; Multilevel converter; Reactive power control; Real time digital simulator; STATCOM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition, 2009. ECCE 2009. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2893-9
  • Electronic_ISBN
    978-1-4244-2893-9
  • Type

    conf

  • DOI
    10.1109/ECCE.2009.5316033
  • Filename
    5316033