• DocumentCode
    227305
  • Title

    Interface method of digital devices testing

  • Author

    Grishkin, Valery ; Yelaev, Yevgeny ; Lopatkin, Grigory ; Mikhailov, Alexander ; Ovsyannikov, Dmitri

  • Author_Institution
    St.-Peterburg State Univ., St. Petersburg, Russia
  • fYear
    2014
  • fDate
    June 30 2014-July 4 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The method of constructing testing impacts for digital devices is proposed. The method is based on the representation device as a set of models data exchange interfaces. This approach allows to build models of input impacts as a collection of standard operations inherent to the corresponding interface.
  • Keywords
    digital circuits; electronic data interchange; electronic equipment testing; test equipment; data exchange interfaces; digital device testing; interface method; representation device; Data models; Educational institutions; Electronic mail; Mathematical model; Simulation; Standards; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electron Sources Conference (IVESC), 2014 Tenth International
  • Conference_Location
    St. Petersburg
  • Print_ISBN
    978-1-4799-5770-5
  • Type

    conf

  • DOI
    10.1109/IVESC.2014.6891994
  • Filename
    6891994
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=227305