Title :
Error analysis of a dimension estimation approach
Author :
Yao, Ning ; Jia, Wenyan ; Sun, Mingui
Author_Institution :
Depts. of Neurosurg., Univ. of Pittsburgh, Pittsburgh, PA, USA
Abstract :
In this paper, we present an error analysis of a previously reported dimension estimation approach using laser diodes. To assess the reliability of the measurement system, we derive the estimation error with respect to a number of influential variables. We concentrate on the error propagation from the intersection estimation/approximation block to the final dimension estimation block, since the integration of the instrument noise, measurement error, numerical error and processing error can be treated as additive white noise. Our analysis shows that the error minimization problem is equivalent to a feature point position selection problem.
Keywords :
error analysis; noise; semiconductor lasers; dimension estimation approach; error analysis; error propagation; estimation error; influential variables; instrument noise; laser diodes; measurement error; numerical error; processing error; white noise; Cameras; Diode lasers; Equations; Error analysis; Image reconstruction; Instruments; Laser beams; Laser modes; Laser theory; Optical sensors;
Conference_Titel :
Bioengineering Conference, Proceedings of the 2010 IEEE 36th Annual Northeast
Conference_Location :
New York, NY
Print_ISBN :
978-1-4244-6879-9
DOI :
10.1109/NEBC.2010.5458168