DocumentCode
227312
Title
Study on the breakdown characteristics of UV illumination switch under microsecond pulse
Author
Liu, Y.F. ; Yan, M.W. ; Wu, J.W. ; Zhou, H.B. ; Fan, C. ; Ding, W.D.
Author_Institution
State Key Lab. of Electr. Insulation for Power Equip., Xi´an Jiaotong Univ., Xi´an, China
fYear
2014
fDate
25-29 May 2014
Firstpage
1
Lastpage
1
Abstract
UV illumination switch is often utilized for pulse sharpening in large pulsed power devices. A lot of work has been done for UV illumination switch under nanosecond pulse1 while the switch under microsecond pulse may show different performance2. The purpose of this study is to figure out the breakdown characteristics of UV illumination switch under microsecond pulse. To analyse the development of discharge channel, the switch with two spherical electrodes and a HV needle electrode inside was designed and ICCD with a minimum exposure time of 10 ns was used to capture images of the discharge. What´s more, a similar higher voltage level switch was designed in this study. HV electrode of the switch was replaceable with three different types: the flat-head, the spherical-head and the saw-toothed. Factors which may influence the switch performance, including arrangement of electrodes, distance of main gap, current-limiting resistance of pre-ionizing gap, rise time of the pulse and gas type were experimeuncertaintyntally studied. Jitter of discharge delay time and uncertainty of breakdown voltage were taken as two important properties to measure the performance of the switch.
Keywords
electric breakdown; pulsed power switches; HV electrode; ICCD; UV illumination switch; breakdown characteristics; breakdown voltage uncertainty; current-limiting resistance; discharge channel; discharge delay time; microsecond pulse; pre-ionizing gap; switch performance; Discharges (electric); Electrodes; Jitter; Lighting; Switches; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS), 2014 IEEE 41st International Conference on
Conference_Location
Washington, DC
Print_ISBN
978-1-4799-2711-1
Type
conf
DOI
10.1109/PLASMA.2014.7012298
Filename
7012298
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