• DocumentCode
    227314
  • Title

    Breakdown characteristics of pseudospark under nanosecond pulsed voltages

  • Author

    Jia Zhang ; Junping Zhao ; Qiaogen Zhang

  • Author_Institution
    Xi´an Jiaotong Univ., Xi´an, China
  • fYear
    2014
  • fDate
    25-29 May 2014
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. The pseudospark discharge has been shown to be a promising source of high brightness, high intensity electron beam pulses. An experimental investigation of pseudospark has been conducted using a flexible discharge chamber. In order to study the breakdown characteristics of pseudospark under nanosecond pulse voltage, some special designs of the electrodes are adopted to improve the stability of pseudospark. In this paper, the breakdown voltage of the pseudospark device is measured for a wide range of gas pressure and anode-cathode gap distance to find the range of gas pressure with different gap distances under nanosecond pulse voltage and the breakdown voltage with different gas pressures and gap distances. In addition, the breakdown characteristics of multi-gap pseudospark discharger have also been researched to study the relationship between the breakdown voltage and the number of the gaps. In the end, an empirical formula is obtained for the breakdown voltage, the gas pressure, the gap distance and the number of the gaps.
  • Keywords
    plasma instability; sparks; anode-cathode gap distance; breakdown characteristics; breakdown voltage; electrodes; empirical formula; flexible discharge chamber; gas pressure; high brightness electron beam pulses; high intensity electron beam pulses; multigap pseudospark discharger; nanosecond pulsed voltages; pseudospark device; pseudospark stability; Breakdown voltage; Discharges (electric); Fault location; Roads; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS), 2014 IEEE 41st International Conference on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4799-2711-1
  • Type

    conf

  • DOI
    10.1109/PLASMA.2014.7012299
  • Filename
    7012299