Title :
MRTD analysis of dielectric cavity structures
Author :
Robertson, R. ; Tentzeris, E. ; Krumpholz, M. ; Katehi, L.P.B.
Author_Institution :
Radiation Lab., Michigan Univ., Ann Arbor, MI, USA
Abstract :
Multiresolution time domain (MRTD) analysis is applied to model anisotropic dielectric material. In particular, an MRTD scheme based on scaling functions only is used to analyze different types of resonant cavity structures. The results agree very well with those obtained by FDTD, FEM and integral equation methods. MRTD allows for considerable savings in memory and computational time in comparison to FDTD, while maintaining the same accuracy of the results.
Keywords :
cavity resonators; dielectric resonators; numerical analysis; time-domain analysis; wavelet transforms; anisotropic dielectric material; dielectric cavity structures; multiresolution time domain analysis; resonant cavity structures; scaling functions; Boundary conditions; Dielectrics; Equations; Magnetic fields; Magnetic flux; Magnetic materials; Material properties; Resonance; Symmetric matrices; Tensile stress;
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-3246-6
DOI :
10.1109/MWSYM.1996.512309
