• DocumentCode
    2273407
  • Title

    Embedded resistive strain sensors for harsh environments

  • Author

    Gouldstone, Christopher ; Brogan, Jeff ; Greenlaw, Rob ; Gambino, Richard J. ; Gutleber, Jonathan ; Sampath, Sanjay ; Longtin, Jon

  • Author_Institution
    MesoScribe Technol. Inc., Stony Brook, NY
  • fYear
    0
  • fDate
    0-0 0
  • Abstract
    Strain gages developed using high-definition direct write technology enable direct bonding to substrates without an adhesive layer, so greater shear forces may be faithfully transmitted and thicker, more robust conductors may be used for strain-sensing. Effects of hysteresis, creep, and temperature limitations common to adhesively-bonded gages can also be mitigated. Manufacture and installation of the gage (and lead wires) are automatic and simultaneous, reducing preparation time and cost. Using the above developed method, industrial-grade strain gages have been fabricated and tested. Standard gage resistances between 120Omega-350Omega have been achieved on grids smaller than 10mm2 using nickel-chrome as the gage material. Thermal plasma-sprayed laser-cut resistive gages have achieved gage factors of 1.3, operating linearly and repeatably for more than 105 cycles between plusmn1000muepsiv. Additional performance metrics, e.g. temperature sensitivity and compensation, were treated in this paper
  • Keywords
    chromium alloys; creep; lead bonding; nickel alloys; plasma arc spraying; strain gauges; strain measurement; strain sensors; 120 to 350 muohm; Ni-Cr; adhesively-bonded gages; direct bonding; embedded resistive strain sensors; high-definition direct write technology; industrial-grade strain gages; nickel-chrome; shear forces; strain-sensing; thermal plasma-sprayed laser-cut resistive gages; Bonding forces; Capacitive sensors; Conductors; Creep; Hysteresis; Manufacturing automation; Plasma temperature; Robustness; Temperature sensors; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference, 2006 IEEE
  • Conference_Location
    Big Sky, MT
  • Print_ISBN
    0-7803-9545-X
  • Type

    conf

  • DOI
    10.1109/AERO.2006.1656094
  • Filename
    1656094