DocumentCode :
2273715
Title :
Finite element analysis of the transducer vibration in die bonding operations
Author :
Kelly, Robert ; Gao, Jian ; Yang, Zhi Jun ; Chen, Xin
Author_Institution :
Guangdong Univ. of Technol., Guangzhou, China
fYear :
2010
fDate :
16-19 Aug. 2010
Firstpage :
884
Lastpage :
888
Abstract :
With the every decreasing pitch spacing of required in the microelectronic packaging industry, higher bond quality is required. In order to further understand the mechanics of the bonding operations, the vibration of the transducer is being studied to identify how bonding quality can be improved. In this paper a computational efficient method of analysing the vibration of the transducer is described, using a combination of a steady analysis and a dynamic analysis to model non linear effects of contact and resistant to motion. The initial results show that the method works, however unknown quantities such as the magnitude of the resistive force have yet to be determined in the laboratory. This model will be useful tool in designing the experiments to determine these unknowns.
Keywords :
finite element analysis; integrated circuit packaging; microassembling; transducers; vibrations; die bonding operations; finite element analysis; microelectronic packaging industry; nonlinear effect model; pitch spacing; resistive force; transducer vibration analysis; ultrasonic transducer vibration analysis; Bonding; Force; Resistance; Steady-state; Transducers; Vibrations; Wire; Die bonding; Dynamic simulation; Ultrasonic Transducer vibration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-8140-8
Type :
conf
DOI :
10.1109/ICEPT.2010.5582401
Filename :
5582401
Link To Document :
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