DocumentCode
2273929
Title
A New Test Chip for CMOS Manufacturing Laboratory Courses at RIT
Author
Baylav, Burak ; Fuller, Lynn ; Kudithipudi, Dhireesha
Author_Institution
Dept. of Microelectron. Eng., Rochester Inst. of Technol., Rochester, NY
fYear
2008
fDate
13-16 July 2008
Firstpage
79
Lastpage
84
Abstract
This paper describes a new CMOS test chip which will be fabricated by students in required CMOS Manufacturing courses in Rochester Institute of Technology (RIT) undergraduate and graduate programs in Microelectronic Engineering. It will be used to expand CMOS technology and verify operation of analog and digital components. Also, the test chip includes a variety of CMOS compatible sensors and signal processing electronics which are necessary to be mounted on the same platform in order to generate basic or complex microsystems. A section of the chip is used for evaluating manufacturing process and transistor parametric characterization. Other sections have basic digital and analog circuits, chip scale packaging designs, and MEMS components.
Keywords
CMOS integrated circuits; chip scale packaging; educational courses; electronic engineering education; integrated circuit manufacture; integrated circuit testing; micromechanical devices; CMOS manufacturing laboratory courses; CMOS test chip; MEMS components; RIT; Rochester Institute of Technology; analog components; chip scale packaging; digital components; microsystems; transistor parametric characterization; CMOS process; CMOS technology; Electronic equipment testing; Laboratories; Manufacturing processes; Microelectronics; Pulp manufacturing; Sensor phenomena and characterization; Signal generators; Signal processing;
fLanguage
English
Publisher
ieee
Conference_Titel
University/Government/Industry Micro/Nano Symposium, 2008. UGIM 2008. 17th Biennial
Conference_Location
Louisville, KY
Print_ISBN
978-1-4244-2484-9
Electronic_ISBN
978-1-4244-2485-6
Type
conf
DOI
10.1109/UGIM.2008.28
Filename
4573206
Link To Document