DocumentCode :
2273929
Title :
A New Test Chip for CMOS Manufacturing Laboratory Courses at RIT
Author :
Baylav, Burak ; Fuller, Lynn ; Kudithipudi, Dhireesha
Author_Institution :
Dept. of Microelectron. Eng., Rochester Inst. of Technol., Rochester, NY
fYear :
2008
fDate :
13-16 July 2008
Firstpage :
79
Lastpage :
84
Abstract :
This paper describes a new CMOS test chip which will be fabricated by students in required CMOS Manufacturing courses in Rochester Institute of Technology (RIT) undergraduate and graduate programs in Microelectronic Engineering. It will be used to expand CMOS technology and verify operation of analog and digital components. Also, the test chip includes a variety of CMOS compatible sensors and signal processing electronics which are necessary to be mounted on the same platform in order to generate basic or complex microsystems. A section of the chip is used for evaluating manufacturing process and transistor parametric characterization. Other sections have basic digital and analog circuits, chip scale packaging designs, and MEMS components.
Keywords :
CMOS integrated circuits; chip scale packaging; educational courses; electronic engineering education; integrated circuit manufacture; integrated circuit testing; micromechanical devices; CMOS manufacturing laboratory courses; CMOS test chip; MEMS components; RIT; Rochester Institute of Technology; analog components; chip scale packaging; digital components; microsystems; transistor parametric characterization; CMOS process; CMOS technology; Electronic equipment testing; Laboratories; Manufacturing processes; Microelectronics; Pulp manufacturing; Sensor phenomena and characterization; Signal generators; Signal processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
University/Government/Industry Micro/Nano Symposium, 2008. UGIM 2008. 17th Biennial
Conference_Location :
Louisville, KY
Print_ISBN :
978-1-4244-2484-9
Electronic_ISBN :
978-1-4244-2485-6
Type :
conf
DOI :
10.1109/UGIM.2008.28
Filename :
4573206
Link To Document :
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