DocumentCode
2274132
Title
Comparison between ground tests and flight data for two static 32 KB memories
Author
Cheynet, Ph. ; Valazco, R. ; Ecoffet, R. ; Duzellier, S. ; David, J.P. ; Loquet, J.G.
Author_Institution
TIMA Lab., Grenoble, France
fYear
1999
fDate
1999
Firstpage
554
Lastpage
557
Abstract
The microelectronics and photonics testbed (MPTB) carrying twenty-four experiments on-board a scientific satellite has been in a high radiation orbit since November 1997. This paper presents single event Upset flight results on two commercial static RAMs includes in two of the MPTB experiments
Keywords
SRAM chips; automatic testing; integrated circuit testing; radiation effects; space vehicle electronics; 32 KB; SEU flight results; SRAM; commercial static RAMs; flight data; ground tests; high radiation orbit; scientific satellite; single event upset; static memory chips; Circuits; Microelectronics; PROM; Photonics; Random access memory; Satellites; Single event upset; Telecommunications; Telemetry; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on
Conference_Location
Fontevraud
Print_ISBN
0-7803-5726-4
Type
conf
DOI
10.1109/RADECS.1999.858646
Filename
858646
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