DocumentCode :
2274370
Title :
Oxidation study of copper wire bonding
Author :
Fan, Xiangquan ; Wang, Techun ; Cong, Yuqi ; Zhang, Binhai ; Jiaji Wang
Author_Institution :
Dept. of Mater. Sci., Fudan Univ., Shanghai, China
fYear :
2010
fDate :
16-19 Aug. 2010
Firstpage :
246
Lastpage :
249
Abstract :
Copper wire bonding is the most effective alternative of gold wire bonding. As copper is more chemical reactive than gold, easier oxidation is one of the most major problem copper wire bonding encountered. Anti-oxidation technology must be used in copper wire bonding process. In general, there are two different ways to improve the anti-oxidation properties of copper bonding wire. One of which is injecting forming gas (FG) containing reducibility; the other is plated anti-oxidation metal coating on 4N pure copper wire. In this paper, we have investigated the performance of copper wire anti-oxidation technology. An optimized forming gas flow rate has been obtained for the pure copper wire. Evidences of anti-oxidation performance have also been shown for Pd-coated copper wire.
Keywords :
chemical reactions; copper; lead bonding; oxidation; Cu; chemical reactive; copper wire antioxidation technology; copper wire bonding process; forming gas injection; gold wire bonding; oxidation study; plated antioxidation metal coating; Bonding; Copper; Oxidation; Surface contamination; Surface morphology; Surface topography; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-8140-8
Type :
conf
DOI :
10.1109/ICEPT.2010.5582431
Filename :
5582431
Link To Document :
بازگشت