• DocumentCode
    2274505
  • Title

    An Analysis and Verification on Deterioration Patterns of Faulted Cables for Resolution of Product Liability Conflicts

  • Author

    Kim, Young-Seok ; Shong, Kil-Mok ; Kim, Sun-Gu

  • Author_Institution
    Korea Electr. Safety Corp., Gyeonggi
  • fYear
    2007
  • fDate
    6-8 Sept. 2007
  • Firstpage
    456
  • Lastpage
    461
  • Abstract
    In order to examine the causes of faulted cables under the operation of product liability(PL) law, it was necessary to database the patterns of faulted cables in materials for electric conductivity and insulation. Accurate analyses such as external and surface analysis were performed for the faulted cables and the over-current was given to copper wire used as a cable conductor for verifying the causes of accidents and a pilot experiment for accident patterns was conducted. Meanwhile, the study performed an experiment for the accident patterns of insulation materials in a state of over-voltage using the cables identical to the faulted cables. Through the reconstructed experiment for the cable, the dielectric breakdown by over-voltage took place and it demonstrated the same form as the faulted cable. Therefore, it has been assumed that the causes of faulted cable would be the dielectric breakdown by product defects due to the dissatisfaction of cable insulation performance for the standards of IEC 60502-1 and IEC 60811-1, rather than the accidents by over-current. These results would be used as scientific data in the event of PL conflicts of electric facilities in Korea in the future.
  • Keywords
    cable insulation; conductors (electric); electric breakdown; fault diagnosis; overvoltage; power cables; cable conductors; cable faults; cable overvoltage; copper wire; dielectric breakdown; electric-conductivity insulation; insulation materials; product liability conflicts; surface analysis; Accidents; Cable insulation; Conducting materials; Databases; Dielectric breakdown; Dielectrics and electrical insulation; IEC standards; Pattern analysis; Performance analysis; Product liability; Dielectric Breakdown; Faulted Cable; Over-voltage; Product Liability Law;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Diagnostics for Electric Machines, Power Electronics and Drives, 2007. SDEMPED 2007. IEEE International Symposium on
  • Conference_Location
    Cracow
  • Print_ISBN
    978-1-4244-1061-3
  • Electronic_ISBN
    978-1-4244-1062-0
  • Type

    conf

  • DOI
    10.1109/DEMPED.2007.4393137
  • Filename
    4393137