DocumentCode
2274727
Title
Techniques to achieve semiconductor reliability in unique power equipment
Author
Smith, Bob H.
Author_Institution
Lawrence Livermore Lab., Univ. of California, Livermore, Livermore, CA, USA
fYear
1974
fDate
10-12 June 1974
Firstpage
119
Lastpage
123
Abstract
Power semiconductors are opening up vast new areas of electrical engineering which were too complex, or too unreliable, or too costly to be attractive previously. Often the standard semiconductor ratings are not applicable. The paper discusses the design engineers reliability problems and covers one approach to this problem. Design charts for surge networks are included.
Keywords
power apparatus; power semiconductor devices; semiconductor device reliability; surges; electrical engineering; power equipment; power semiconductor reliability; surge network; Power supplies; Rectifiers; Reliability; Semiconductor diodes; Standards; Surges; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Specialists Conference, 1974 IEEE
Conference_Location
Murray Hill, NJ
ISSN
0275-9306
Type
conf
DOI
10.1109/PESC.1974.7074336
Filename
7074336
Link To Document