• DocumentCode
    2274908
  • Title

    Effects of Ce addition on properties of Sn-0.3Ag-0.7Cu low-Ag lead-free solder

  • Author

    Liu, Xue ; Wang, Lifeng ; Wang, Jia ; Lv, Ye

  • Author_Institution
    Coll. of Mater. Sci. & Eng., Harbin Univ. of Sci. & Technol., Harbin, China
  • fYear
    2010
  • fDate
    16-19 Aug. 2010
  • Firstpage
    176
  • Lastpage
    180
  • Abstract
    The effects of the rare earth Ce element on melting temperature, wettability of Sn-0.3Ag-0.7Cu low-Ag lead-free solder and the intermetallic compounds morphologies of Sn-0.3Ag-0.7Cu-XCe/Cu were investigated. The addition of the Ce element has an unconspicuous effect on decreasing the melting temperature of Sn-0.3Ag-0.7Cu solder. The results indicate that the addition of Ce element increases the wettability of solder alloy. When the content of Ce is 0.05 wt. %, the spreading area of solder joint is the highest by 50.80 mm2 which is 8% higher than that of Sn-0.3Ag-0.7Cu lead-free solder. The 3-D morphology of intermetallic compounds (IMC) shows that the addition of Ce promotes grain refinement. The diameter of the grains decreases continuously as the content of Ce increase. It indicated that the addition of Ce elements suppresses the growth of the thickness of intermetallic compounds layer (IML). The microstructure of Sn-0.3Ag-0.7Cu-0.05Ce/Cu is more stable than that of the Sn-0.3Ag-0.7Cu/Cu and the grains´ microstructure became thick and coarse with the increase of thermal aging time.
  • Keywords
    ageing; alloying additions; cerium alloys; copper; copper alloys; crystal microstructure; grain refinement; grain size; melting point; silver alloys; solders; tin alloys; wetting; Ce content; SnAgCuCe-Cu; grain diameter; grain microstructure; grain refinement; intermetallic compounds; low-Ag lead-free solder alloy; melting temperature; morphological properties; rare earth Ce element addition effects; solder joint spreading area; thermal aging time; wettability; Compounds; Intermetallic; Microstructure; Morphology; Soldering; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-8140-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2010.5582451
  • Filename
    5582451