Title :
Femtosecond lasers in precision time and frequency metrology
Author :
Diddams, Scott A. ; Oates, C.W. ; Curtis, E.A. ; Itano, W.M. ; Drullinger, R.E. ; Wineland, D.J. ; Bergquist, J.C. ; Hollberg, L. ; Udem, Th. ; Ma, L.-S. ; Robertsson, L.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
Summary form only given. As a recent test of the femtosecond-laser-based optical clockwork, we have compared two femtosecond lasers that have their spectra broadened to /spl sim/300 THz in microstructure fiber. The discrete frequency modes of each octave-spanning spectrum are phase-locked to a common continuous wave laser. The measured instability of the heterodyne beat between the two femtosecond systems demonstrates that the intrinsic noise of each system is /spl les/6.3 /spl times/ 10/sup -16/ in 1 s of averaging across the 300 THz bandwidth. Furthermore, the average frequencies of the frequency modes of the two systems are found to agree within an uncertainty of /spl les/4 /spl times/ 10/sup -17/ across the entire octave. This demonstrates the possibility to transfer the sub-Hertz stability and accuracy of the best current optical standards to /spl sim/500,000 individual oscillators across the visible and near-infrared spectrum.
Keywords :
atomic clocks; frequency standards; high-speed optical techniques; laser mode locking; solid lasers; 300 THz; Ca optical frequency standards; Hg/sup +/ optical frequency standards; atomic clocks; common continuous wave laser; femtosecond lasers; femtosecond-laser-based optical clockwork; frequency modes; heterodyne beat instability; intrinsic noise; microstructure fiber; near-infrared spectrum; octave-spanning spectrum; phase-locked discrete frequency modes; precision frequency metrology; precision time metrology; spectral broadening; visible spectrum; Clocks; Fiber lasers; Frequency; Laser modes; Laser noise; Metrology; Microstructure; Optical fiber testing; Optical mixing; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
DOI :
10.1109/CLEO.2002.1034340