Title :
Time-resolved measurements of bit-error-rate and optical-signal-to-noise-ratio degradations caused by EDFA gain dynamics in a WDM network
Author :
Wong, W.S. ; Huan-Shang Tsai ; Chien-Jen Chen ; Hak Kyu Lee ; Min-Chen Ho
Author_Institution :
Onetta Inc., Sunnyvale, CA, USA
Abstract :
Summary from only given. We demonstrated the usefulness of a new technique for making time-resolved measurements of bit error rate (BER) and optical signal to noise ratio (OSNR). As an example, we measured the OSNR and the BER of a surviving channel as the channel loading was varied by 100%. A severe drop of 5 dB in OSNR was observed despite the fact that the channel power decreased by 3 dB only.
Keywords :
high-speed optical techniques; optical fibre networks; optical noise; telecommunication channels; telecommunication network reliability; wavelength division multiplexing; BER; EDFA gain dynamics; OSNR; WDM network; bit error rate; channel loading; channel power; optical signal to noise ratio; severe OSNR drop; surviving channel; time-resolved measurements; Bit error rate; Degradation; Optical attenuators; Optical filters; Optical noise; Optical receivers; Optical saturation; Pulse measurements; Signal to noise ratio; Time measurement;
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
DOI :
10.1109/CLEO.2002.1034347
