Title :
An accurate statistical yield model for CMOS current-steering D/A converters
Author :
van den Bosch, A. ; Steyaert, M. ; Sansen, Willy
Author_Institution :
Dept. of Electr. Eng., Katholieke Univ., Leuven, Heverlee
Abstract :
To obtain a high resolution CMOS current-steering digital-to-analog converter, the matching behavior of the current source transistors is one of the key issues in the design. At this moment, these matching properties are taken into account by the use of time consuming and CPU intensive Monte Carlo simulations. In this paper a formula is derived that allows us to accurately describe the impact of the mismatch on the INL (integral non-linearity) yield of current-steering D/A converters without any loss of design time
Keywords :
CMOS integrated circuits; digital-analogue conversion; impedance matching; integrated circuit modelling; integrated circuit yield; probability; statistical analysis; CMOS current-steering DAC; D/A converters; INL yield; current source transistors; digital-to-analog converter; high resolution DAC; integral nonlinearity; matching behavior; statistical yield model; CMOS digital integrated circuits; CMOS technology; Central Processing Unit; Digital-analog conversion; GSM; HDTV; Semiconductor device modeling; Signal design; Silicon; Wireless communication;
Conference_Titel :
Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
Conference_Location :
Geneva
Print_ISBN :
0-7803-5482-6
DOI :
10.1109/ISCAS.2000.858699
