DocumentCode
2275309
Title
Leakage Current Property of Pb(Zr0.4 , Ti0.6 )O3 Thin-film Capacitors with Highly Rectangular Hysteresis Property
Author
Okamura, Soichiro ; Tanimura, Mitsumasa ; Shima, Hiromi ; Naganuma, Hiroshi
Author_Institution
Tokyo Univ. of Sci., Tokyo
fYear
2007
fDate
27-31 May 2007
Firstpage
91
Lastpage
93
Abstract
The Pb(Zr0.4,Ti0.6)O3 thin-film capacitors with top and bottom Pt electrodes were prepared by chemical solution deposition using the precursor solutions with Pb contents ranging from 104 to 119%. Leakage current densities of the PZT capacitors monotonically decreased with increasing Pb contents. In the Pb110%-PZT capacitor, a conduction mechanism changed from the Schottky emission to the Poole-Frenkel at an electric field of approximately 80 kV/cm at RT while the leakage current was limited only by the Poole-Frenkel in case of less Pb contents. In the Pb110%-PZT capacitor, the Schottky barrier height and a relative permittivity were estimated to be 1.1 eV and 4.8, respectively, and the activation energy of trap sites in the Poole-Frenkel conduction was estimated to be 0.5 eV.
Keywords
Poole-Frenkel effect; Schottky effect; ferroelectric capacitors; lead compounds; leakage currents; liquid phase deposition; permittivity; thin film capacitors; zirconium compounds; PZT; PZT capacitors; Poole-Frenkel cvonduction; Schottky emission; activation energy; chemical solution deposition; leakage current; permittivity; rectangular hysteresis; thin film capacitors; Capacitors; Current measurement; Density measurement; Electrodes; Ferroelectric materials; Hysteresis; Leakage current; Pulse measurements; Sputtering; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on
Conference_Location
Nara
ISSN
1099-4734
Print_ISBN
978-1-4244-1334-8
Electronic_ISBN
1099-4734
Type
conf
DOI
10.1109/ISAF.2007.4393176
Filename
4393176
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