DocumentCode
2275484
Title
A finite element simulation of PoP assembly processes
Author
Ren, Chao ; Qin, Fei ; Wang, Xuming
Author_Institution
Coll. of Mech. Eng. & Appl. Electron. Technol., Beijing Univ. of Technol., Beijing, China
fYear
2010
fDate
16-19 Aug. 2010
Firstpage
112
Lastpage
115
Abstract
Warpage, high stress in dies and solder joints are introduced in assembly process of a package-on-package component. In this paper, a finite element approach is proposed to predict the warpages and stresses during the full assembly process. By the techniques of element die and birth as well as restart method, the approach is able to transfer the stress and warpage in one process to the next so that a full evolution of the stress and warpage during assembly can be obtained. The simulation results show that the approach is feasible and effective, and it can be used to optimize the packaging process.
Keywords
assembling; finite element analysis; packaging; soldering; stress analysis; PoP assembly processes; dies; finite element simulation; package-on-package component; packaging process; solder joints; stresses; warpage; Assembly; Electronics packaging; Finite element methods; Packaging; Semiconductor device modeling; Stress; Temperature; Assembly processes; Electronic Packaging; Finite element method; PoP;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
Conference_Location
Xi´an
Print_ISBN
978-1-4244-8140-8
Type
conf
DOI
10.1109/ICEPT.2010.5582476
Filename
5582476
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