• DocumentCode
    2275484
  • Title

    A finite element simulation of PoP assembly processes

  • Author

    Ren, Chao ; Qin, Fei ; Wang, Xuming

  • Author_Institution
    Coll. of Mech. Eng. & Appl. Electron. Technol., Beijing Univ. of Technol., Beijing, China
  • fYear
    2010
  • fDate
    16-19 Aug. 2010
  • Firstpage
    112
  • Lastpage
    115
  • Abstract
    Warpage, high stress in dies and solder joints are introduced in assembly process of a package-on-package component. In this paper, a finite element approach is proposed to predict the warpages and stresses during the full assembly process. By the techniques of element die and birth as well as restart method, the approach is able to transfer the stress and warpage in one process to the next so that a full evolution of the stress and warpage during assembly can be obtained. The simulation results show that the approach is feasible and effective, and it can be used to optimize the packaging process.
  • Keywords
    assembling; finite element analysis; packaging; soldering; stress analysis; PoP assembly processes; dies; finite element simulation; package-on-package component; packaging process; solder joints; stresses; warpage; Assembly; Electronics packaging; Finite element methods; Packaging; Semiconductor device modeling; Stress; Temperature; Assembly processes; Electronic Packaging; Finite element method; PoP;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-8140-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2010.5582476
  • Filename
    5582476