• DocumentCode
    2275739
  • Title

    Application of D-STATCOM to improve distribution system performance with balanced and unbalanced fault conditions

  • Author

    Hosseini, S.H. ; Nazarloo, A. ; Babaei, E.

  • Author_Institution
    Fac. of Electr. & Comput. Eng., Univ. of Tabriz, Tabriz, Iran
  • fYear
    2010
  • fDate
    25-27 Aug. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper proposes a new control method for D-STATCOM (Distribution STATIC Compensator) control system. The operation of this proposed control method enables D-STATCOM to mitigate all types of fault, intelligently (such as Single Line to Ground (SLG) fault and Double Phase to Ground (DPG) fault and three-phase fault). In this paper, the 12-pulse D-STATCOM configuration with IGBT is designed and the graphic based models of the DSTATCOM are developed using the PSCAD/EMTDC electromagnetic transient simulation program. This paper validates the performance of a D-STATCOM system for improving distribution system performance under all types of fault. The reliability and robustness of the control scheme in the system response to the voltage sags caused by SLG and DPG and three-phase faults is obviously proved in the simulation results.
  • Keywords
    insulated gate bipolar transistors; power distribution control; power distribution faults; power distribution reliability; power supply quality; static VAr compensators; D-STATCOM; IGBT; PSCAD-EMTDC electromagnetic transient simulation program; balanced fault conditions; distribution static compensator control system; distribution system performance; double phase to ground fault; single line to ground fault; three-phase fault; unbalanced fault conditions; voltage sags; Automatic voltage control; Inverters; Load modeling; Power quality; Voltage fluctuations; Voltage measurement; Balanced and Unbalanced Faults; D-STATCOM; Energy Storage Systems; Voltage Sags;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electric Power and Energy Conference (EPEC), 2010 IEEE
  • Conference_Location
    Halifax, NS
  • Print_ISBN
    978-1-4244-8186-6
  • Type

    conf

  • DOI
    10.1109/EPEC.2010.5697178
  • Filename
    5697178