DocumentCode
2275770
Title
A novel approach for functional coverage measurement in HDL
Author
Liu, Chien-Nan Jimmy ; Chang, Chen-Yi ; Jou, Jing-Yang ; Lai, Ming-Chih ; Juan, Hsing-Ming
Author_Institution
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume
4
fYear
2000
fDate
2000
Firstpage
217
Abstract
While the coverage-driven functional verification is getting popular, a fast and convenient coverage measurement tool is necessary. In this paper, we propose a novel approach for functional coverage measurement based on the VCD files produced by the simulators. The usage flow of the proposed dumpfile-based coverage analysis is much easier and smoother than that of existing instrumentation-based coverage tools. No pre-processing tool is required and no extra code will be inserted into the source code. Most importantly, the flexibility in choosing coverage metrics and measured code regions is increased. Only one simulation run is needed for any kind of coverage reports. By conducting some experiments on real examples, it shows very promising results in terms of the performance and the accuracy of coverage reports
Keywords
circuit simulation; directed graphs; formal verification; hardware description languages; HDL; VCD files; coverage metrics; dumpfile-based coverage analysis; functional coverage measurement; instrumentation-based coverage tools; measured code regions; Analytical models; Circuit simulation; Circuit synthesis; Circuit testing; Computer languages; Councils; Hardware design languages; Instruments; Performance analysis; Process design;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
Conference_Location
Geneva
Print_ISBN
0-7803-5482-6
Type
conf
DOI
10.1109/ISCAS.2000.858727
Filename
858727
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