Title :
A novel approach for functional coverage measurement in HDL
Author :
Liu, Chien-Nan Jimmy ; Chang, Chen-Yi ; Jou, Jing-Yang ; Lai, Ming-Chih ; Juan, Hsing-Ming
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
While the coverage-driven functional verification is getting popular, a fast and convenient coverage measurement tool is necessary. In this paper, we propose a novel approach for functional coverage measurement based on the VCD files produced by the simulators. The usage flow of the proposed dumpfile-based coverage analysis is much easier and smoother than that of existing instrumentation-based coverage tools. No pre-processing tool is required and no extra code will be inserted into the source code. Most importantly, the flexibility in choosing coverage metrics and measured code regions is increased. Only one simulation run is needed for any kind of coverage reports. By conducting some experiments on real examples, it shows very promising results in terms of the performance and the accuracy of coverage reports
Keywords :
circuit simulation; directed graphs; formal verification; hardware description languages; HDL; VCD files; coverage metrics; dumpfile-based coverage analysis; functional coverage measurement; instrumentation-based coverage tools; measured code regions; Analytical models; Circuit simulation; Circuit synthesis; Circuit testing; Computer languages; Councils; Hardware design languages; Instruments; Performance analysis; Process design;
Conference_Titel :
Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on
Conference_Location :
Geneva
Print_ISBN :
0-7803-5482-6
DOI :
10.1109/ISCAS.2000.858727