Title :
Nonlinear Dielectric Bahaviour of Metal/Ferroelectric/Metal and Metal/Ferroelectric/Semiconductor-Heterostructures
Author :
Barz, K. ; Diestelhorst, M. ; Beige, H. ; Geske, L. ; Alexe, M. ; Hesse, D.
Author_Institution :
Martin-Luther-Univ., Halle-Wittenberg
Abstract :
The influence of size effects and of the microstructure of interfaces and thin films on the linear properties of ferroelectrics is presently a widely studied topic world-wide. However, their influence on nonlinear properties of nanoscaled ferroelectrics is widely unknown. The paper is devoted to the well-defined preparation of nanoscaled ferroelectrics and to investigations into the influence of size and microstructure effects on their nonlinear properties. Different metal/ferroelectric/metal-(MFM) and metal/ferroelectric/semiconductor-(MFS) heterostructures were prepared. The ferroelectric materials used are PZT and bismuth titanate. The nonlinear dielectric properties where analyzed by inspecting the amplitude-frequency-characteristics of a nonlinear series resonance circuit, which contained the heterostructures as nonlinear capacitance.
Keywords :
bismuth compounds; capacitance; ferroelectric thin films; lead compounds; multilayers; nanostructured materials; BiTiO; PZT; amplitude-frequency-characteristics; bismuth titanate; interfaces; linear property; metal-ferroelectric-metal heterostructure; metal-ferroelectric-semiconductor heterostructure; microstructure; nanoscaled ferroelectrics; nonlinear capacitance; nonlinear dielectric property; resonance circuit; size effects; thin films; well-defined preparation; Automatic frequency control; Dielectric thin films; Ferroelectric materials; Impedance measurement; Magnetic force microscopy; Microstructure; Nonlinear equations; Physics; RLC circuits; Resonance;
Conference_Titel :
Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on
Conference_Location :
Nara
Print_ISBN :
978-1-4244-1334-8
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2007.4393217