Title :
THz electroluminescence from Si/SiGe quantum cascade heterostructures
Author :
Bates, R. ; Lynch, Stephen A. ; Paul, Douglas J. ; Ikonic, Zoran ; Kelsall, R.W. ; Harrison, Peter ; Norris, David J. ; Cullis, A.G. ; Arnone, D.D. ; Pidgeon, C.R. ; Murzyn, P. ; Loudon, A.
Author_Institution :
Cavendish Lab., Cambridge Univ., UK
Abstract :
Summary form only given. THz electroluminescence from a Si/SiGe quantum cascade structure operating significantly above liquid helium temperatures was demonstrated. The band structure was engineered to give surface normal emission utilising a light-hole (LH) to heavy-hole (HH) valence intersubband transition. Samples were grown by low-pressure chemical vapour deposition on a strain relaxed SiGe buffer. The epitaxial layer thickness of the structure and Ge mole-fraction were characterised by transmission electron microscopy (TEM), energy filtered TEM (EFTEM) and energy dispersive X-rays (XRD). The results are promising for the development of an electrically pumped silicon based THz quantum cascade laser operating at liquid nitrogen temperatures.
Keywords :
Ge-Si alloys; band structure; electroluminescence; elemental semiconductors; semiconductor materials; semiconductor quantum wells; silicon; submillimetre wave generation; transmission electron microscopy; 77 K; Ge mole-fraction; Si-SiGe; Si/SiGe quantum cascade heterostructures; TEM; THz electroluminescence; THz quantum cascade laser; band structure; epitaxial layer thickness; light hole-heavy hole valence intersubband transition; low-pressure chemical vapour deposition; strain relaxed SiGe buffer; surface normal emission; transmission electron microscopy; Capacitive sensors; Chemical vapor deposition; Electroluminescence; Epitaxial layers; Germanium silicon alloys; Helium; Power engineering and energy; Quantum cascade lasers; Silicon germanium; Temperature;
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
DOI :
10.1109/CLEO.2002.1034407