DocumentCode
2276419
Title
Calibrating a sampling voltmeter using a binary Josephson system
Author
Van den Brom, Helko E. ; Houtzager, Ernest ; Martina, Quincy E V N ; Rietveld, Gert
Author_Institution
NMi Van Swinden Lab., Delft
fYear
2008
fDate
8-13 June 2008
Firstpage
100
Lastpage
101
Abstract
A binary Josephson system was used to characterize an 81/2-digit sampling voltmeter. This voltmeter is the heart of the primary standard for power at 50 Hz or 60 Hz at several National Metrology Institutes (NMIs). In this paper, we present first results on the calibration of the voltmeter under conditions that mimic its use in the power standard set-up. Furthermore, the dependence of the root-mean-square (rms) voltage FRMS on the aperture time is presented.
Keywords
calibration; measurement standards; superconducting junction devices; voltage measurement; voltmeters; NMI; National Metrology Institutes; binary Josephson system; frequency 50 Hz; frequency 60 Hz; root-mean-square voltage; sampling voltmeter calibration; voltage measurement; voltage standard; Apertures; Calibration; Josephson junctions; Linearity; Oscilloscopes; Power measurement; Sampling methods; System testing; Voltage; Voltmeters;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
Conference_Location
Broomfield, CO
Print_ISBN
978-1-4244-2399-6
Electronic_ISBN
978-1-4244-2400-9
Type
conf
DOI
10.1109/CPEM.2008.4574672
Filename
4574672
Link To Document