DocumentCode :
2276527
Title :
Leveraging Advanced Process Control (APC) technology in developing Predictive Maintenance (PdM) systems
Author :
Moyne, J. ; Ward, N. ; Hawkins, P.
Author_Institution :
Appl. Mater., Appl. Global Services, Santa Clara, CA, USA
fYear :
2012
fDate :
15-17 May 2012
Firstpage :
221
Lastpage :
226
Abstract :
Predictive Maintenance (PdM) systems use process and equipment state information to predict when a tool or a particular component in a tool might need maintenance. PdM systems can be realized cost-effectively by leveraging Advanced Process Control (APC) technologies and infrastructure. APC data collection infrastructure can provide the state information necessary for prediction. APC fault detection systems contain necessary algorithms to identify features important to prediction, including tool health. In leveraging APC systems in a reusable and reconfigurable way, cost-effective PdM systems can be realized as part of existing fab infrastructure, leading to lower unscheduled downtimes, reduced mean-time-to-repair, reduced scrap, and increased life of components and consumables.
Keywords :
maintenance engineering; process control; semiconductor industry; APC data collection infrastructure; APC fault detection system; advanced process control technology; predictive maintenance system; semiconductor industry; tool health; Data models; Fault detection; Maintenance engineering; Predictive models; Process control; Prognostics and health management; Schedules; APC; Advanced Process Control; PHM; PdM; Predictive Maintenance; Prognostics Health Management; unscheduled downtime;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference (ASMC), 2012 23rd Annual SEMI
Conference_Location :
Saratoga Springs, NY
ISSN :
1078-8743
Print_ISBN :
978-1-4673-0350-7
Type :
conf
DOI :
10.1109/ASMC.2012.6212893
Filename :
6212893
Link To Document :
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