DocumentCode :
2276688
Title :
Continuous wave ultraviolet laser induced frustration of etching in congruent lithium niobate
Author :
Mailis, S. ; Riziotis, C. ; Eason, R.W.
Author_Institution :
Optoelectron. Res. Centre, Southampton Univ., UK
fYear :
2002
fDate :
24-24 May 2002
Firstpage :
645
Abstract :
Summary form only given. Light induced frustration of etching (LIFE) describes the effect of the partial suppression or complete cancellation of chemical etching in the presence of light. We report on the latent frustration of etching which has been observed on the -z face of undoped congruent lithium niobate single crystals induced by prior illumination with a frequency doubled Ar/sup +/ continuous wave laser at 244 nm. It is a latent effect as the laser beam does not have to be present during the etching procedure in HF acid and enables the fabrication of surface relief micron-size features in a simple exposure development manner. Preliminary examination of the etch frustrated area using micro-Raman analysis showed small broadening and shifting of some spectral lines, when compared with the unaffected material, suggesting structural modifications of the surface.
Keywords :
Raman spectra; etching; laser beam effects; spectral line broadening; spectral line shift; spectrochemical analysis; surface topography; ultraviolet radiation effects; 244 nm; Ar/sup +/; HF; HF acid; LiNbO/sub 3/; chemical etching; continuous wave ultraviolet laser induced frustration; etch frustrated area; frequency doubled Ar/sup +/ continuous wave laser; latent effect; latent frustration; micro-Raman analysis; prior illumination; simple exposure development; small broadening; spectral line shifting; surface relief micron-size features; surface structural modifications; undoped congruent lithium niobate single crystals; Argon; Chemical lasers; Crystals; Etching; Frequency; Hafnium; Laser beams; Lighting; Lithium niobate; Optical device fabrication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
Type :
conf
DOI :
10.1109/CLEO.2002.1034430
Filename :
1034430
Link To Document :
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