DocumentCode :
2276698
Title :
Two methods for improving electrochemical migration resistance of printed wiring boards
Author :
Ohki, Y. ; Hirose, Y. ; Wada, G. ; Asakawa, H. ; Tanaka, T. ; Maeno, T. ; Okamoto, K.
Author_Institution :
Fac. of Sci. & Eng., Waseda Univ., Tokyo, Japan
fYear :
2012
fDate :
17-20 Sept. 2012
Firstpage :
548
Lastpage :
552
Abstract :
Experiments were carried out using space charge distribution measurements as a major measurement method in order to find effective measures to suppress electrochemical migration (ECM) along the thickness direction of a printed wiring board (PWB). As a result, the following valuable knowledge was obtained. First, in a PWB consisting of paper/ phenol-resin composite and a copper electrode, the electrical resistivity of epoxy resin used as an adhesive layer to connect the composite and the electrode is usually higher than that of the composite. In such a case, ECM is easily grown in the PWB. The resistance against ECM was found to increase significantly if we use an adhesive layer with a similar electrical resistivity to the insulating material in a PWB. Another important fact is that the growth of ECM can be suppressed if silica nanofillers were added to epoxy resin in the case of an epoxy-based PWB.
Keywords :
adhesives; charge measurement; electrical resistivity; insulating materials; printed circuits; resins; ECM; PWB; adhesive layer; copper electrode; electrical resistivity; electrochemical migration resistance improvement; epoxy resin; insulating material; paper-phenol-resin composite; printed wiring boards; silica nanofillers; space charge distribution measurements; thickness direction; Anodes; Electric fields; Electronic countermeasures; Epoxy resins; Moisture; Space charge; Voltage measurement; electrochemical migration; printed wiring board;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Voltage Engineering and Application (ICHVE), 2012 International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4673-4747-1
Type :
conf
DOI :
10.1109/ICHVE.2012.6357042
Filename :
6357042
Link To Document :
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