• DocumentCode
    2276752
  • Title

    Assessing the impact of the 450mm wafer size transition on manufacturing facility automated material handling systems

  • Author

    Hennessy, Larry

  • Author_Institution
    Factory Autom., CH2M HILL, Tempe, AZ, USA
  • fYear
    2012
  • fDate
    15-17 May 2012
  • Firstpage
    245
  • Lastpage
    250
  • Abstract
    The emergence of 450mm diameter wafers and the associated equipment technology will once again challenge how greenfield semiconductor manufacturing factories are configured and how the production process will be automated. These changes to manufacturing facilities require seamless integration of the automation designer and manufacturing facility designer to address the full proliferation of the Automated Material Handling System (AMHS) within the production space and to account for the expanding ceiling-mounted front opening unified pod (FOUP) storage. Due to the larger physical dimensions of 450mm manufacturing equipment, existing generations of 300mm fabs are not optimized for 450mm manufacturing. In fact, the production (cleanroom) areas of most state-of-the-art 300mm fabs are too small by almost half to support efficient 450mm manufacturing. Other anticipated changes - such as taller cleanroom ceiling heights and increased floor loading specifications - are required to enable future generations of 450mm manufacturing equipment and to enable the ITRS roadmap. These facility changes may, in turn, drastically impact the way in which AMHS systems are configured in order to maximize facility productivity. This paper will discuss the anticipated changes that 450mm manufacturing facilities will undergo and how the AMHS must adapt to and take advantage of these facility differences. It also reinforces our recommendation that the AMHS design process be executed concurrently with the development of the process tool layout, cleanroom and factility design processes.
  • Keywords
    clean rooms; design engineering; environmental factors; materials handling equipment; production facilities; semiconductor device manufacture; wafer-scale integration; AMHS design process; FOUP storage; ITRS roadmap; automated material handling systems; automated production process; automation designer; ceiling-mounted front opening unified pod storage; cleanroom ceiling heights; equipment technology; floor loading specifications; greenfield semiconductor manufacturing factories; manufacturing facility designer; process tool layout; size 300 mm; size 450 mm; wafer size transition; Floors; Layout; Loading; Manufacturing; Production facilities; Vehicles; 300mm; 450mm; AMHS; FOUP; automated material handling systems; semiconductor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference (ASMC), 2012 23rd Annual SEMI
  • Conference_Location
    Saratoga Springs, NY
  • ISSN
    1078-8743
  • Print_ISBN
    978-1-4673-0350-7
  • Type

    conf

  • DOI
    10.1109/ASMC.2012.6212905
  • Filename
    6212905