• DocumentCode
    2276872
  • Title

    SIM comparison of dc resistance at 1 Ω, 1 MΩ, and 1 GΩ

  • Author

    Jarrett, D.G. ; Elmquist, R.E. ; Zhang, N.F. ; Tonina, A. ; Porfiri, M. ; Femandes, J. ; Schechter, H. ; Izquierdo, D. ; Faverio, C. ; Slomovitz, D. ; Inglis, D. ; Wendler, K. ; Hernandez, F. ; Rodriguez, B.

  • Author_Institution
    Stat. Eng. Div., NIST, Gaithersburg, MD
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    146
  • Lastpage
    147
  • Abstract
    A regional comparison of DC resistance standards at the nominal values of 1 Omega, 1 MOmega, and 1 GOmega has recently been completed in the Sistema Interamericano de Metrogia (SIM) region. The motivation, design, standards, and results of this regional comparison are reported.
  • Keywords
    electric resistance measurement; measurement standards; DC resistance standards; SIM; Sistema Interamericano de Metrogia; regional standards comparison; resistance 1 Gohm; resistance 1 Mohm; resistance 1 ohm; Councils; Electrical resistance measurement; Laboratories; Measurement standards; Metrology; NIST; Particle measurements; Protocols; Resistors; Standardization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on
  • Conference_Location
    Broomfield, CO
  • Print_ISBN
    978-1-4244-2399-6
  • Electronic_ISBN
    978-1-4244-2400-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2008.4574695
  • Filename
    4574695
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2276872