Ferroelectric domain in PMN-xPT single crystal studied by piezoresponse force microscopy and finite element analysis

Author

Wong, K.S. ; Wang, B. ; Dai, J.Y. ; Luo, H.S.

Author_Institution

Hong Kong Polytech. Univ., Hong Kong

fYear

2007

fDate

27-31 May 2007

Firstpage

353

Lastpage

356

Abstract

Ferroelectric domain structures in (001)-cut (Pb(Mg_1/3Nb_2/3)O₃)_0.62(PbTiO₃)_0.38 and (001)-cut (Pb(Mg_1/3Nb_2/3)O₃)_0.4(PbTiO₃)o.6 single crystals have been studied by means of piezoresponse force microscopy. The out-of-plane and in-plane domain image reveal the domain pattern in the crystal. Finite element analysis is carried out to interpreate the superposition domain structure and its corresponding domain imaging.

Keywords

electric domains; ferroelectric materials; finite element analysis; lead compounds; (001)-cut single crystal; (011)-cut single crystals; PMN-xPT single crystal; PbMg_0.33Nb_0.67O₃PbTiO₃; ferroelectric domain structures; finite element analysis; in-plane domain image; out-of-plane image; piezoresponse force microscopy; superposition domain structure; Ceramics; Chromium; Crystal microstructure; Electrodes; Ferroelectric materials; Finite element methods; Image analysis; Microscopy; Optical imaging; Piezoelectric polarization;

fLanguage

English

Publisher

ieee

Conference_Titel

Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on

Conference_Location

Nara

ISSN

1099-4734

Print_ISBN

978-1-4244-1334-8

Electronic_ISBN

1099-4734

Type

conf

DOI

10.1109/ISAF.2007.4393263

Filename

4393263