Title :
A particle-in-cell/Monte Carlo simulation of a capacitively coupled chlorine discharge
Author :
Shuo Huang ; Gudmundsson, J.T.
Author_Institution :
Joint Inst., Univ. of Michigan-Shanghai Jiao Tong Univ., Shanghai, China
Abstract :
Summary form only given. We demonstrate the oopd1 (object oriented plasma device for one dimension) particle-in-cell/Monte Carlo simulation tool for the capacitively coupled chlorine discharge with a comprehensive reaction set [1]. We explore a typical capacitively coupled chlorine discharge operated at both single frequency [1] and dual frequency [2,3] using oopd1 and obtain key plasma parameters, including particle density, effective electron temperature, electron energy probability function and ion energy and angular distributions for both Cl+ and Cl2+ ions. The dependence of the plasma parameters on the discharge pressure, driving frequency, driving current density and secondary electron emission, is systematically investigated. As the pressure increases from 5 mTorr to 100 mTorr, the heating mechanism evolves from both stochastic and ohmic heating to predominantly ohmic heating and the electron heating outweighs the ion heating at high pressure. Also, the density profile for Cl2+ and Cl- ions becomes flat in the bulk region and the electronegativity increases with increasing pressure. The creation of Cl+ ions in the sheath region is mainly due to conversion from Cl2+ ions to Cl+ ions through non-resonant charge exchange, while in the bulk region the creation of Cl+ ions is mainly ascribed to electron impact ionization processes. As the low-frequency current density is increased the flux of Cl2+ ions to the surface increases only slightly while the average energy of Cl2+ ions to the surface increases almost linearly with increasing low-frequency current, which shows possible independent control of the flux and energy of Cl2+ ions by varying the low-frequency current in a dual-frequency capacitively coupled chlorine discharge. However, the increase of the flux of Cl+ ions with i- creasing low-frequency current, which is mainly due to the increased dissociation fraction of the background gas caused by extra power supplied by the low-frequency source, is undesirable.
Keywords :
Monte Carlo methods; chlorine; current density; dissociation; electron impact ionisation; electronegativity; ion density; plasma density; plasma devices; plasma heating; plasma sheaths; plasma simulation; plasma temperature; probability; stochastic processes; surface discharges; Cl2+; Cl+; Monte Carlo simulation tool; angular distributions; chlorine ion density profile; discharge pressure; dissociation fraction; dual-frequency capacitively coupled chlorine discharge; effective electron temperature; electron energy probability function; electron impact ionization processes; electronegativity; heating mechanism; low-frequency current density; low-frequency source; nonresonant charge exchange; object oriented plasma device; ohmic heating; particle density; particle-in-cell simulation tool; pressure 5 mtorr to 100 mtorr; secondary electron emission; sheath region; stochastic heating; Discharges (electric); Educational institutions; Fault location; Heating; Ions; Monte Carlo methods;
Conference_Titel :
Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS), 2014 IEEE 41st International Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4799-2711-1
DOI :
10.1109/PLASMA.2014.7012492