DocumentCode :
2277128
Title :
High-k/metal gates in leading edge silicon devices
Author :
James, Dick
Author_Institution :
Chipworks, Ottawa, ON, Canada
fYear :
2012
fDate :
15-17 May 2012
Firstpage :
346
Lastpage :
353
Abstract :
2007 saw the introduction of the first high-k/metal gate (HKMG) devices into the marketplace. This marked the return of metal-gate technology on silicon for the first time since polysilicon gates became ubiquitous in the early 1970s. Intel was the first to use high-k/metal gate in its 45-nm product. Other leading-edge manufacturers have now launched HKMG products in both gate-first and gate-last forms, and in the near future we also expect to see the first 22-nm FinFET products come onto the market. Chipworks, as a supplier of competitive intelligence to the semiconductor and electronics industries, monitors the evolution of chip processes as they come into commercial production. Chipworks has obtained parts from the leading edge manufacturers, and performed structural analyses to examine the features and manufacturing processes of the devices. The paper discusses some of the different transistor structures we have seen during the evolution of the HKMG technology, and examines the first 32/28-nm parts that were introduced.
Keywords :
MOSFET; elemental semiconductors; silicon; Chipworks; FinFET; electronics industries; high-k/metal gates; leading edge devices; metal-gate technology; polysilicon gates; semiconductor industries; size 22 nm; size 45 nm; High K dielectric materials; Logic gates; MOSFETs; Metals; Stress; Advanced Materials; Advanced Processes; FEOL; Transistor Structures;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference (ASMC), 2012 23rd Annual SEMI
Conference_Location :
Saratoga Springs, NY
ISSN :
1078-8743
Print_ISBN :
978-1-4673-0350-7
Type :
conf
DOI :
10.1109/ASMC.2012.6212925
Filename :
6212925
Link To Document :
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