DocumentCode :
2277305
Title :
Structural and ferroelectric properties of BiFeO3-BiCoO3 solid solution films
Author :
Naganuma, Hiroshi ; Shimura, Nozomi ; Shima, Hiromi ; Yasui, Shintaro ; Nishida, Ken ; Iijima, Takashi ; Funakubo, Hiroshi ; Okamura, Soichiro
Author_Institution :
Univ. of Sci., Tokyo
fYear :
2007
fDate :
27-31 May 2007
Firstpage :
428
Lastpage :
430
Abstract :
BiFeO3-BiCoO3 solid solution films were fabricated by a chemical solution deposition (CSD) method onto the Pt/Ti/SiO2/Si(100) substrates followed by a post-deposition annealing at 873 K for 10 min. X-ray diffraction measurements indicate the apparent phase transition of the Bi(CoxFe1-times)O3 solid solution films by increasing the cobalt composition were take place at the cobalt composition of around x = 0.2 and 0.4, respectively. According to the D-E hysteresis measurements, the ferroelectricity observed at the cobalt composition less than x = 0.3 indicating that the MPB has a possibility to exist at these composition region.
Keywords :
X-ray diffraction; annealing; bismuth compounds; dielectric hysteresis; ferroelectric thin films; ferroelectric transitions; liquid phase deposition; BiFeO3-BiCO3; D-E hysteresis measurements; Pt-Ti-SiO2-Si; X-ray diffraction; chemical solution deposition; ferroelectric solid solution films; phase transition; post deposition annealing; temperature 873 K; time 10 min; Annealing; Chemicals; Cobalt; Ferroelectric films; Ferroelectric materials; Hysteresis; Iron; Phase measurement; Solids; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on
Conference_Location :
Nara
ISSN :
1099-4734
Print_ISBN :
978-1-4244-1334-8
Electronic_ISBN :
1099-4734
Type :
conf
DOI :
10.1109/ISAF.2007.4393288
Filename :
4393288
Link To Document :
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