Title :
Decoupling capacitor modeling and characterization for power supply noise in 3D systems
Author :
Xu, Zheng ; Putnam, Christopher ; Gu, Xiaoxiong ; Scheuermann, Michael ; Rose, Kenneth ; Webb, Buckwell ; Knickerbocker, John ; Lu, Jian-Qiang
Author_Institution :
Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
Decoupling capacitors are essential to reduce high transient current noise and to provide a low impedance power delivery path. 3D technology has several advantages for power delivery, and this work investigates the impacts of decoupling capacitors on through-silicon-via (TSV)-based 3D power networks using a novel hybrid modeling approach, i.e., combining electromagnetic (EM) and SPICE simulations. We first partitioned a 3D system into a number of components, extracted the RLGC parasitics for each decomposed physical element, and imported them into an assembled system-level equivalent circuit. Through comparing and analyzing the effectiveness of several decoupling strategies, design tradeoffs are made in selecting the proper values and placement of decoupling capacitors to ensure optimal power distribution solution in 3D architectures.
Keywords :
assembling; capacitors; equivalent circuits; integrated circuit modelling; power supply circuits; three-dimensional integrated circuits; transients; 3D architectures; 3D systems; 3D technology; RLGC parasitics; TSV-based 3D power networks; assembled system-level equivalent circuit; decomposed physical element; decoupling capacitor characterization; decoupling capacitor modeling; decoupling capacitors; decoupling strategy; design tradeoffs; hybrid modeling approach; low impedance power delivery path; optimal power distribution solution; power supply noise; through-silicon-via-based 3D power networks; transient current noise; Capacitors; Integrated circuit modeling; Power grids; Solid modeling; System-on-a-chip; Three dimensional displays; Wires; μC-4; 3D integration; C-4; TSV; decoupling capacitor; electromagnetic; modeling; packaging; power delivery;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference (ASMC), 2012 23rd Annual SEMI
Conference_Location :
Saratoga Springs, NY
Print_ISBN :
978-1-4673-0350-7
DOI :
10.1109/ASMC.2012.6212938