Title :
Embedded wafer level ball grid array (eWLB)
Author :
Brunnbauer, M. ; Furgut, E. ; Beer, G. ; Meyer, T.
Author_Institution :
Infineon Technol. AG, Regensburg
Abstract :
Wafer level packaging is gaining tremendous interest throughout the semiconductor industry, due to advantages in cost and performance. We report an embedded device technology, which is based on a molded 200 mm reconfigured wafer. Our approach is a way around the restrictions of standard wafer level packages, like the number of I/Os possible at a given pitch. This allows us to establish a broad packaging platform based on wafer level processes. The core process of this technology is the encapsulation of silicon dice. We demonstrate that compression molding is a promising approach for the embedding of devices with respect to topology, adhesion and reliability properties. The new technology we present here is a competitive solution delivering reliable ball grid array (BGA) packages.
Keywords :
ball grid arrays; compression moulding; encapsulation; reliability; silicon; 200 mm; adhesion properties; broad packaging platform; compression molding; embedded device technology; embedded wafer level ball grid array; encapsulation; reliability properties; semiconductor industry; topology properties; wafer level packaging; Adhesives; Compression molding; Costs; Electronics industry; Electronics packaging; Encapsulation; Semiconductor device packaging; Silicon; Topology; Wafer scale integration;
Conference_Titel :
Electronics Packaging Technology Conference, 2006. EPTC '06. 8th
Conference_Location :
Singapore
Print_ISBN :
1-4244-0664-1
Electronic_ISBN :
1-4244-0665-X
DOI :
10.1109/EPTC.2006.342681